Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/77039
Title: | Shock and Damage Models in Reliability Theory |
Authors: | Nakagawa, Toshio |
Keywords: | Shock and Damage Models in Reliability Theory |
Issue Date: | 2007 |
Publisher: | Springer |
URI: | http://10.6.20.12:80/handle/123456789/77039 |
ISBN: | 1-84628-442-2 |
Appears in Collections: | Electrical and Computer Engineering |
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