Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/77039
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dc.contributor.authorNakagawa, Toshio-
dc.date.accessioned2019-07-26T07:35:43Z-
dc.date.available2019-07-26T07:35:43Z-
dc.date.issued2007-
dc.identifier.isbn1-84628-442-2-
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/77039-
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.subjectShock and Damage Models in Reliability Theoryen_US
dc.titleShock and Damage Models in Reliability Theoryen_US
dc.typeBooken_US
Appears in Collections:Electrical and Computer Engineering

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