Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/7177
Title: Life-Cycle Assessment of Semiconductors
Authors: Boyd, Sarah B.
Keywords: Cycle Assessment ; Semiconductors
Issue Date: 2013
Publisher: Springer
URI: http://10.6.20.12:80/handle/123456789/7177
ISBN: 978-1-4419-9987-0
255
Appears in Collections:Chemical Engineering

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