Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/35390Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | . GARRETT, PATRICK H | - |
| dc.date.accessioned | 2019-01-15T11:06:41Z | - |
| dc.date.available | 2019-01-15T11:06:41Z | - |
| dc.date.issued | 2002 | - |
| dc.identifier.isbn | 0-471-20506-0 | - |
| dc.identifier.isbn | 218 | en_US |
| dc.identifier.uri | http://10.6.20.12:80/handle/123456789/35390 | - |
| dc.language.iso | en | en_US |
| dc.publisher | John Wiley & Sons, Inc., New York. All rights reserved. | en_US |
| dc.subject | Electrooptical devices | en_US |
| dc.subject | Testing Congresses. | en_US |
| dc.title | MULTISENSOR INSTRUMENTATION 6 DESIGN Defined Accuracy Computer-Integrated Measurement Systems | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Electrical and Computer Engineering | |
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